Paper accepted for CHI'2023
Our paper on measurements patterns for makers and manufacturing was accepted for the CHI'2023 conference. Co-authors are Raf Ramakers, Danny Leen, Jeeeun Kim, Steven Houben and Tom Veuskens
Our paper on measurements patterns for makers and manufacturing was accepted for the CHI'2023 conference. Co-authors are Raf Ramakers, Danny Leen, Jeeeun Kim, Steven Houben and Tom Veuskens